Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Basic Properties
Place of Origin:
China
Brand Name:
Sinuo
Certification:
Calibration Certificate(Cost Additional )
Model Number:
SN2210-2T
Trading Properties
Minimum Order Quantity:
1
Price:
Customized
Payment Terms:
T/T
Supply Ability:
100 sets per month
Specifications
| Test Standard: | IEC 61032 And IEC 60529 IP2X | Applied Figure: | Figure 2 |
| Handle Material: | Nylon | Probe Material: | Stainless Steel |
| Force: | 0-50N | Accessory: | M6 Thread And Banana Clip |
| High Light: | IEC61032 Test Probe,60529 IP2X Test Probe,IEC 60529 Test Probe |
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Product Description
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Product information:
This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.
Technical parameters:
| Parameters /Model | SN2210-2T |
| Name | Standard test probe with force |
| Joint 1 | 30±0.2 (mm) |
| Joint 2 | 60±0.2 (mm) |
| Finger length | 80±0.2 (mm) |
| Fingertip to baffle | 180±0.2 (mm) |
| Cylindrical | R2±0.05 (mm) |
| Spherical | S4±0.05 (mm) |
| Fingertip cutting bevel angle | 37o 0 -10’ |
| Fingertip taper | 14 o 0 -10’ |
| Test finger diameter | Ф12 0 -0.05 (mm) |
| A-A Section diameter | Ф50(mm) |
| A-A Section width | 20±0.2 |
| Baffle diameter | Ф75±0.2(mm) |
| Baffle thickness | 5±0.5(mm) |
| Built-in Force | 0-50N force, resolution of 5N |