MOQ: | 1 |
Price: | Customized |
Standard Packaging: | Aluminium Box |
Delivery Period: | 3 Days |
Payment Method: | T/T |
Supply Capacity: | 100 sets per month |
IEC 62151 Figure 3 Telecom Test Probe 2C For Bare Parts Of TNV Circuits Protection Test
Product information:
Standards: Conforms to IEC60065:2014 Annex B, IEC 62151 Figure 3, IEC60950 figure 2C and UL6500 figure B.1 and etc.
Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.
Test sample:Information technology equipment.
Feature:Nylon handle + stainless steel probe.
Technical Parameters:
Probe length | 80 mm |
End radius | R6 mm |
Probe diameter | Φ12 mm |
Baffle diameter of the handle | 50 mm |
Sinuohave a full range of test probes according to different standards, and also can offer customized service.
Test procedures and operation
Please refer to the relevant standards.
Take IEC 60950 clause 2.1.1.1 as an example:
This test probe is applied to openings, without appreciable force, in every possible position, except that floor-standing equipment having a mass exceeding 40 kg is not tilted.
The test probe doesn’t have built-in force, if specific applied force required, the test probe should work together with a force gauge. At the end of our probe handle, there is a M6 thread hole to match the force gauge. Showing as following reference picture:
Notice
1. Please do not damage the appliance shape (such as scratching, bending, etc.).
2. Prevented from dust and moisture environment, in order to avoid the oxidation to affect the dimensional accuracy.
3. Be careful of electric shock.
MOQ: | 1 |
Price: | Customized |
Standard Packaging: | Aluminium Box |
Delivery Period: | 3 Days |
Payment Method: | T/T |
Supply Capacity: | 100 sets per month |
IEC 62151 Figure 3 Telecom Test Probe 2C For Bare Parts Of TNV Circuits Protection Test
Product information:
Standards: Conforms to IEC60065:2014 Annex B, IEC 62151 Figure 3, IEC60950 figure 2C and UL6500 figure B.1 and etc.
Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.
Test sample:Information technology equipment.
Feature:Nylon handle + stainless steel probe.
Technical Parameters:
Probe length | 80 mm |
End radius | R6 mm |
Probe diameter | Φ12 mm |
Baffle diameter of the handle | 50 mm |
Sinuohave a full range of test probes according to different standards, and also can offer customized service.
Test procedures and operation
Please refer to the relevant standards.
Take IEC 60950 clause 2.1.1.1 as an example:
This test probe is applied to openings, without appreciable force, in every possible position, except that floor-standing equipment having a mass exceeding 40 kg is not tilted.
The test probe doesn’t have built-in force, if specific applied force required, the test probe should work together with a force gauge. At the end of our probe handle, there is a M6 thread hole to match the force gauge. Showing as following reference picture:
Notice
1. Please do not damage the appliance shape (such as scratching, bending, etc.).
2. Prevented from dust and moisture environment, in order to avoid the oxidation to affect the dimensional accuracy.
3. Be careful of electric shock.