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Product Details:
Payment & Shipping Terms:
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| Standard: | IEC 62368-1 | Clause: | 5.3.2, 5.4.10, V.1.4 And Figure V.3 |
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| Baffle Diameter Of The Handle: | 50±0.2 Mm | Probe Diameter: | Φ12+0.05 0 Mm |
| End Radius: | R6+0.05 0 Mm | Probe Length: | 80±0.2 Mm |
| High Light: | Clause 5.3.2 Blunt Probe,IEC 62368-1 Blunt Probe,Figure V.3 Telecom Test Probe |
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IEC 62368-1 Clause 5.3.2, 5.4.10, V.1.4 and Figure V.3 Blunt Probe
Product Information:
Standard:The test probe is designed and manufactured according to the standard requirements of IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3, IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3, UL6500 figure B.1, and etc.
Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.
Test sample:Information technology equipment.
Feature:Nylon handle + stainless steel probe.
Technical Parameters:
| Standard | IEC 62368-1 |
| Clause | 5.3.2, 5.4.10, V.1.4 and figure V.3 |
| Probe length | 80±0.2 mm |
| End radius | R6+0.05 0 mm |
| Probe diameter | Φ12+0.05 0 mm |
| Baffle diameter of the handle | 50±0.2 mm |
Contact Person: Ms. Zoe Zou
Tel: +86 13527656435
Fax: 86-020-39185976
| Factory Address:Room 101, 1st Floor, No. 6, Third Street, Pingshan Industrial Zone 511495, Shibi Street, Panyu District, Guangzhou, China | |
| Sales office:Room 101, 1st Floor, No. 6, Third Street, Pingshan Industrial Zone 511495, Shibi Street, Panyu District, Guangzhou, China | |
| +86-020-39185976 | |
| sales@sinuotek.com | |
